ProgramMaster Logo
Conference Tools for 2022 TMS Annual Meeting & Exhibition
Login
Register as a New User
Help
Submit An Abstract
Propose A Symposium
Presenter/Author Tools
Organizer/Editor Tools
About this Abstract
Meeting 2022 TMS Annual Meeting & Exhibition
Symposium Electronic Packaging and Interconnections
Presentation Title Thermal Expansions of βSn and Bi in Sn-Bi Alloys
Author(s) Qichao Hao, Xin Fu Tan, Qinfen Gu, Stuart McDonald, Kazuhiro Nogita
On-Site Speaker (Planned) Qichao Hao
Abstract Scope During the soldering process and the daily operation of the electronic devices, solder alloys experience temperature variation frequently. The mismatch in volume expansion of the solder alloys and the interconnected components can result in stresses which lead to failure. In an alloy system with high solubility of one element in another, the effects of thermal expansion and the solubility limits are both important contributing factors to the thermal induced volume change. In this study, Sn-57wt%Bi and Sn-37wt%Bi alloys which are promising material for low-temperature solders were investigated by in-situ heating synchrotron X-ray diffraction (XRD) to reveal the changes of the lattice parameters of Sn and Bi. Density functional theory (DFT) calculations was adopted to reveal the influence of the solid solution of Bi on the lattice parameters of βSn, thereby decoupling the effects of thermal expansion and solid solution of Bi on the thermal induced volume change of Sn.
Proceedings Inclusion? Planned:
Keywords Electronic Materials, Other,

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Characterisation of η-(Cu,Ni)6Sn5 Formed between Cu-xNi/Sn Couples
Characterising the Intermetallic Layer in Mixed Sn-Bi Paste/SAC BGA Solder Ball Joints
Comparing Intermetallic Compound Formation in Solder Interconnects under Different Current Load Conditions
Corrosion Mechanism of Co-based Surface Finishing Layer
Cu-Cu Bonding with Silver Thin Film Capping Layer
Development of Silver─Tin Alloy Paste for High Power IC Packaging by High Energy Ball Milling
Die-bonding Performance and Mechanism of Ag Micron Paste with Pressure-less Sintering
Effect of Geopolymer Ceramic Reinforcement to the Microstructure Formation and Mechanical Properties of Sn-0.7Cu Solder Joint
Effect of Grain Size and Stress Relaxation on Whisker Growth under Applied Pressure
Electromigration Behaviors of Nanotwinned Ag Interconnects
Electromigration of Cu-Cu Joints Fabricated by of Highly (111)-oriented Nanotwinned Cu
Enhancing Mechanical Properties via Adding Ni and Zn in Cu/Sn3.5Ag/Cu TLP Soldering by TCB Process
In-situ Observation of Liquid Solder Alloys and Solid Substrate Reactions Using High-voltage Transmission Electron Microscopy
In-situ Observations of Sn-58Bi/SAC305 Joints by Synchrotron Imaging
Interfacial Reaction between Cu and In-48Sn Alloy
Length Scale Dependent Mechanical Behaviour of Elastically Constrained Sn Rich Solder Joints
Low-thermal-budget Hybrid Cu-Cu Bonding with Highly <111>-oriented Nanotwinned Cu and Polyimide
Low Temperature and Presureless Cu-to-Cu Direct Bonding by Sintering of Green Synthesized Cu Nanoparticles
Low Temperature Direct Bonding in Atmosphere on Highly (111) Oriented Nanotwinned Silver
Low Temperature Solder Interconnect Board Level Shock Performance at Elevated Temperature
Microstructural Evolution of Bi Phase during Reflow and Thermal Aging in Sn-58Bi Solder
NOW ON-DEMAND ONLY - Stress Development in Solder Interconnects under Pulsed Electric Current
NOW ON-DEMAND ONLY – Study of Creep Properties of Sn-Ag-Cu Alloys Employing Different Strain Rates Using Nanoindentation
NOW ON-DEMAND ONLY - Tin Whisker Growth in Space
Power Cycling and Thermal Cycling Performance of Pressureless Silver Sintered Silicon Carbide Power Module Compared to Lead-free Solder Joint
Surface Precipitation and Growth of Bismuth Particles in Sn-Ag-Cu-Bi Solder Joints
Synchrotron X-ray Study of Cu Electromigration in A Blech Structure
The Role of Lengthscale in the Creep of Sn-3Ag-0.5Cu Solder with Controlled Microstructure
Thermal Cycling Reliability Tests of Cu-Cu Joints by Two-step Bonding Processes
Thermal Expansions of βSn and Bi in Sn-Bi Alloys
Transient Liquid Phase (TLP) Bonding in Cu-Ni/Sn-0.7Cu/Cu-Ni Joints
Wire Bonding Novel 3D Air-metal Dielectric Structures with ISIG Passivation: Process Development and Reliability

Questions about ProgramMaster? Contact programming@programmaster.org