ProgramMaster Logo
Conference Tools for 2022 TMS Annual Meeting & Exhibition
Login
Register as a New User
Help
Submit An Abstract
Propose A Symposium
Presenter/Author Tools
Organizer/Editor Tools
About this Abstract
Meeting 2022 TMS Annual Meeting & Exhibition
Symposium Electronic Packaging and Interconnections
Presentation Title Corrosion Mechanism of Co-based Surface Finishing Layer
Author(s) Si-Wei Lin, Albert T. Wu
On-Site Speaker (Planned) Si-Wei Lin
Abstract Scope The reliability of electronic devices in harsh conditions becomes significant for rapid development of 5G network and automobile industry. When devices are exposed to air-polluted environment, corrosion of the surface finishing layer could damage the reliability of the devices. In the study, corrosion behaviors of Co-based films on printed circuit boards (PCBs) are investigated. Electroless-Co and Electroless-Co/Electroless-Pd/Immersion Au layers were deposited on PCBs for comparison. Samples were placed in a chamber at 80 。C and 100% relative humidity (RH) with different concentration of SO2 for corrosion tests. After corrosion tests, the morphology and components of corrosion products were characterized. The electrochemical analysis provides the understanding of the corrosion mechanism. The results show that the Co-based layers can effectively enhance the corrosion resistance of the PCBs.
Proceedings Inclusion? Planned:
Keywords Electronic Materials, Copper / Nickel / Cobalt, Surface Modification and Coatings

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Characterisation of η-(Cu,Ni)6Sn5 Formed between Cu-xNi/Sn Couples
Characterising the Intermetallic Layer in Mixed Sn-Bi Paste/SAC BGA Solder Ball Joints
Comparing Intermetallic Compound Formation in Solder Interconnects under Different Current Load Conditions
Corrosion Mechanism of Co-based Surface Finishing Layer
Cu-Cu Bonding with Silver Thin Film Capping Layer
Development of Silver─Tin Alloy Paste for High Power IC Packaging by High Energy Ball Milling
Die-bonding Performance and Mechanism of Ag Micron Paste with Pressure-less Sintering
Effect of Geopolymer Ceramic Reinforcement to the Microstructure Formation and Mechanical Properties of Sn-0.7Cu Solder Joint
Effect of Grain Size and Stress Relaxation on Whisker Growth under Applied Pressure
Electromigration Behaviors of Nanotwinned Ag Interconnects
Electromigration of Cu-Cu Joints Fabricated by of Highly (111)-oriented Nanotwinned Cu
Enhancing Mechanical Properties via Adding Ni and Zn in Cu/Sn3.5Ag/Cu TLP Soldering by TCB Process
In-situ Observation of Liquid Solder Alloys and Solid Substrate Reactions Using High-voltage Transmission Electron Microscopy
In-situ Observations of Sn-58Bi/SAC305 Joints by Synchrotron Imaging
Interfacial Reaction between Cu and In-48Sn Alloy
Length Scale Dependent Mechanical Behaviour of Elastically Constrained Sn Rich Solder Joints
Low-thermal-budget Hybrid Cu-Cu Bonding with Highly <111>-oriented Nanotwinned Cu and Polyimide
Low Temperature and Presureless Cu-to-Cu Direct Bonding by Sintering of Green Synthesized Cu Nanoparticles
Low Temperature Direct Bonding in Atmosphere on Highly (111) Oriented Nanotwinned Silver
Low Temperature Solder Interconnect Board Level Shock Performance at Elevated Temperature
Microstructural Evolution of Bi Phase during Reflow and Thermal Aging in Sn-58Bi Solder
NOW ON-DEMAND ONLY - Stress Development in Solder Interconnects under Pulsed Electric Current
NOW ON-DEMAND ONLY – Study of Creep Properties of Sn-Ag-Cu Alloys Employing Different Strain Rates Using Nanoindentation
NOW ON-DEMAND ONLY - Tin Whisker Growth in Space
Power Cycling and Thermal Cycling Performance of Pressureless Silver Sintered Silicon Carbide Power Module Compared to Lead-free Solder Joint
Surface Precipitation and Growth of Bismuth Particles in Sn-Ag-Cu-Bi Solder Joints
Synchrotron X-ray Study of Cu Electromigration in A Blech Structure
The Role of Lengthscale in the Creep of Sn-3Ag-0.5Cu Solder with Controlled Microstructure
Thermal Cycling Reliability Tests of Cu-Cu Joints by Two-step Bonding Processes
Thermal Expansions of βSn and Bi in Sn-Bi Alloys
Transient Liquid Phase (TLP) Bonding in Cu-Ni/Sn-0.7Cu/Cu-Ni Joints
Wire Bonding Novel 3D Air-metal Dielectric Structures with ISIG Passivation: Process Development and Reliability

Questions about ProgramMaster? Contact programming@programmaster.org