| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XXII
|
| Presentation Title |
Electric Current-induced Lattice Strain and Grain Orientation Change in Silver Strip |
| Author(s) |
Shih-kang Lin, Yu-chen Liu, Ciou-Ren Lee |
| On-Site Speaker (Planned) |
Shih-kang Lin |
| Abstract Scope |
Electromigration is the electric current-induced atomic migration and causes microstructure change including void/hillock formation, grain rotation, etc. Although electromigration-induced grain rotation in anisotropic Sn material had been well studied, how grain orientation is changed in isotropic materials such as Ag is still not clear. In this study, in situ synchrotron-radiation-based X-ray diffraction revealed that electric current induced an instant lattice strain and the strain would reach a steady state. Based on transmission electron microscopic and electron backscatter diffraction observation, when the steady state strain exceeded a critical value, hillock formation, abnormal grain growth, dislocation density increase, and grain orientation change were observed. We discuss the underlying mechanism of the current-induced grain orientation change in terms of defect dynamics in this study. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Other, Other, Other |