|About this Abstract
||7th World Congress on Integrated Computational Materials Engineering (ICME 2023)
||Validation of Crystal Plasticity Simulations using High-energy X-ray Diffraction Microscopy Measurements
||Saikumar Reddy Yeratapally, George R Weber, Edward H Glaessgen
|On-Site Speaker (Planned)
||Saikumar Reddy Yeratapally
A three-dimensional microstructure of additively manufactured (AM) and post-processed Inconel-625 alloy generated as part of the AFRL’s Additive Manufacturing Challenge Series is considered for the purpose of validating the modeling predictions of a crystal plasticity finite element (CPFE) solver. Far-field high-energy X-Ray diffraction microscopy (ff-HEDM) measurements of grain-average elastic strains, on a specimen loaded in tension at room temperature, are compared with predictions from a CPFE framework. The ff-HEDM measurements, obtained while the specimen was held under load-control, were made on the same microstructure considered in the CPFE framework. This one-to-one comparison enables a detailed study of the sources of discrepancy between simulation and experiment, including a thorough investigation of the sources of modeling errors. It is shown that over-constrained boundary conditions and the inability of the CPFE solver to account for stress-relaxation events (which happens during the constant-load holds) contribute to the modeling errors.