| About this Abstract |
| Meeting |
MS&T22: Materials Science & Technology
|
| Symposium
|
Advances in Emerging Electronic Nanomaterials: Synthesis, Enhanced Properties, Integration, and Applications
|
| Presentation Title |
Correlative Analyses of Low-dimensional Materials |
| Author(s) |
Veronika Hegrova, Radek Dao, Jan Neuman |
| On-Site Speaker (Planned) |
Veronika Hegrova |
| Abstract Scope |
Correlative microscopy, in general, combines different imaging systems and their benefits to understanding the material principles. It has become an essential tool helping us understand the complexity of the sample properties. When we imagine the setup of two complementary techniques, atomic force microscopy (AFM) and scanning electron microscopy (SEM), it has several advantages, such as multimodal measurement, under in-situ conditions and precise localization to the area of interest.
In low-dimensional materials, lots of time is spent searching the area of interest due to their small size. Correlative Probe and Electron Microscopy (CPEM) is a unique method allowing for precise AFM and SEM data correlation. The images are acquired simultaneously from both devices in the same coordinate system enabling the connection of mechanical, electrical, and material properties. Thus, resulting 3D CPEM views can combine multiple channels from AFM and SEM, enabling thorough sample analysis and clear data interpretation. |