About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
In-situ Experiment for SEM DIC and HREBSD Over a Concurrent Domain |
Author(s) |
Will Gilliland, Timothy Ruggles, Kaitlynn Conway, Jacob Hochhalter, Jay Carrol |
On-Site Speaker (Planned) |
Will Gilliland |
Abstract Scope |
Experimental full-field stress and strain data is a valuable tool to understand material response and crystal plasticity. Such data is invaluable to calibrate and verify crystal plasticity finite element simulations. Methods for acquiring such data exist in digital image correlation (DIC) and high-resolution electron backscatter diffraction (HREBSD) to calculate strain and stress, respectively, but are difficult to combine over a concurrent domain due to EBSD being incompatible with typical DIC surface preparation. In this work, a new technique called microstamping is used to apply EBSD compatible selective electron transparent DIC patterns to acquire both data modalities during in-situ loading over the same domain without the need to remove or reapply a pattern on the surface for DIC. Tests are initially preformed on polycrystalline additive-manufactured nickel superalloy followed by nickel oligocrystal manufactured with columnar grains for controlled experiments. SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525 |
Proceedings Inclusion? |
Planned: |
Keywords |
Mechanical Properties, Characterization, |