About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Quantifying Complex Defect Structures Created by Advanced Manufacturing using X-ray Diffraction |
Author(s) |
Levente Balogh, Lucas Ravkov, Ondrej Muránsky |
On-Site Speaker (Planned) |
Levente Balogh |
Abstract Scope |
Various manufacturing methods, including novel techniques such as Additive Manufacturing, frequently produce samples having unique, often metastable complex features the characterization of which can present a challenge. X-ray scattering data, besides information on crystal structure, etc., also carries detailed information on the various crystallographic defects present in materials: dislocations, radiation-induced defects, grain/sub-grain boundaries, twinning and stacking faults. These defects, the population of which are often referred to as the microstructure, are strongly correlated to the mechanical properties of materials.
The lecture will briefly introduce the audience to the capabilities of whole pattern Diffraction Line Profile Analysis (DLPA), a modern tool for microstructure characterization based on first-principle physical models. A synchrotron X-ray-based technique will be presented which allows the mapping of the microstructure in samples where defect populations vary as a function of location. The dislocation structure of as-printed Additively Manufactured materials will also be discussed. |
Proceedings Inclusion? |
Planned: |
Keywords |
Additive Manufacturing, Characterization, |