About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
In Situ Characterization of Dislocation Types in 3D using Dark Field X-ray Microscopy |
Author(s) |
Sina Borgi, Grethe Winther, Henning Friis Poulsen |
On-Site Speaker (Planned) |
Sina Borgi |
Abstract Scope |
I present the research on in situ 3D characterization of dislocation patterning during deformation using Dark-Field X-ray Microscopy (DFXM). The angular sensitivity of DFXM (~10-3 degrees) enables visualization of dislocation strain fields with excellent contrast to the crystal lattice. DFXM snapshots individual dislocations in a 2D slice, revealing their presence deep within the bulk sample. By stacking slices, I visualize extended 3D volumes, capturing strain increments as small as 3*10-5. Individual dislocations in a mm-sized aluminum single crystal are identified, and tracked during early stage plastic deformation. I also conduct forward simulations of DFXM images based on micromechanical models formulated with the deformation gradient tensor field, displaying the importance of combining experimental data and simulations in identifying dislocation types. I discuss the potential of DFXM for dislocation type identification in bulk samples and explore the interface between forward simulation tools and dislocation dynamics, focusing on implementation, results, and limitations. |
Proceedings Inclusion? |
Planned: |
Keywords |
Aluminum, Modeling and Simulation, Mechanical Properties |