About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
|
Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
Mapping Dislocation Density in Additively Manufactured SS316L Specimens with Varying Aspect Ratio |
Author(s) |
Lucas Andre Ravkov, Levente Balogh, Don Brown |
On-Site Speaker (Planned) |
Lucas Andre Ravkov |
Abstract Scope |
High-energy synchrotron X-ray diffraction measurements were conducted in a grid pattern on the cross section of two additively manufactured SS316L specimens, consisting of 1512 measurement locations in a 28 mm x 14 mm area, with over 12000 individual diffraction patterns obtained. Software was developed to extract the Full Width at Half Maximum (FWHM) and the position of every reflection in each of the ~12000 patterns using non-linear least squares fitting. Analysis of peak broadening (FWHM) versus grid position reveals that the highest level of residual stresses are found in the skin region of the printed specimens, and that residual stresses vary with the aspect ratio of the parts. Full-pattern Diffraction Line Profile Analysis (DLPA) combined with modified Williamson-Hall analysis is performed to quantitatively determine the dislocation density versus location. The obtained DLPA results are then compared to contour technique measurements, and Finite Element (FE) predictions to validate applied plasticity models. |
Proceedings Inclusion? |
Planned: |
Keywords |
Additive Manufacturing, Characterization, Iron and Steel |