About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Simulating Dark-Field X-ray Microscopy Images of Complex Discrete Dislocation Structures |
Author(s) |
Yifan Wang, Nicolas Bertin, Kento Katagiri, Sara Jessica Irvine, Robert E. Rudd, Leora E. Dresselhaus-Marais |
On-Site Speaker (Planned) |
Yifan Wang |
Abstract Scope |
Dislocation evolution and interaction are the fundamental mechanisms of plastic deformation in crystalline materials. Although being extensively studied by transmission electron microscopy (TEM) in thin-film materials, direct observation of dislocations remains challenging for bulk-phase dislocation evolution. Dark-field X-ray Microscopy (DFXM) is a novel full-field imaging technique for mapping micro-structures and local deformation deep in the bulk phase of crystalline materials. Despite the success of DFXM in mapping the dislocation evolution near the melting temperature, how the images can be interpreted for high dislocation density remains unclear. Here, we combine the geometrical formalism of DFXM with discrete dislocation dynamics (DDD) and molecular dynamics (MD), to understand the DFXM patterns generated from complex dislocation structures at different dislocation densities. The formalism is applied to dislocation networks in the diamond during shock compression. The method developed in this work can potentially help design and interpret future DFXM experiments in high-dislocation-density systems. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Computational Materials Science & Engineering, Modeling and Simulation |