About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
|
Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
Assessing Prismatic-to-prismatic Slip Transfer Across Grain Boundaries in Pure Ti via High Resolution Digital Image Correlation |
Author(s) |
Eugenia Nieto Valeiras, Alberto Orozco-Caballero, Maral Sarebanzadeh, Jun Sun, Javier Llorca |
On-Site Speaker (Planned) |
Eugenia Nieto Valeiras |
Abstract Scope |
Slip transmission across grain boundaries has been analyzed by means of high-resolution digital image correlation (HR-DIC) in a pure Ti sample prone to prismatic slip. The 3D microstructural information was acquired by laboratory diffraction contrast tomography, and, thus, all the parameters that characterize grain boundaries were available prior to deformation. The majority of grain boundaries followed the usual prismatic-to-prismatic slip transfer trends, where the probability of slip transfer is dictated by favorable geometrical alignment between incoming and outgoing slip systems. However, some atypical behaviors were observed, such as delayed slip transfer, partial slip transfer, and slip transfer involving poorly oriented slip systems. These occurrences were triggered by the local stress state, as shown by the results of HR-DIC, pointing out the limitations of geometric criteria alone to predict slip transfer across grain boundaries. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Titanium, Thin Films and Interfaces |