| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Enhanced SEM-based Electron Diffraction Analyses Using Intelligent Hybrid Pattern Matching |
| Author(s) |
Michael Hjelmstad, Pat Trimby, Aimo Winkelmann |
| On-Site Speaker (Planned) |
Michael Hjelmstad |
| Abstract Scope |
The use of diffraction pattern matching (PM) techniques for indexing electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) patterns is increasingly widespread. Much of the published work takes a “brute force” approach whereby potentially valuable phase and orientation data determined from Hough transform indexing (HTI) are rejected and all possible phases and orientations are considered during the PM process. Since HTI is a fast and proven indexing method, it can instead be used as an effective starting point for an alternative PM approach, whereby simulations are limited to the local orientation space, pseudosymmetric equivalents, similar phases, or subtle variations in crystal structure (such as those caused by polarity switches). This hybrid PM method has many benefits in terms of both speed and data quality; this talk will explore some of these advantages with worked examples from both materials science and geology. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, Other |