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Meeting 2024 TMS Annual Meeting & Exhibition
Symposium Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
Presentation Title A Multi-generational Study of Detectors for Use in Cross-correlation-based EBSD: From Scintillators to Direct Detection
Author(s) Josh Kacher
On-Site Speaker (Planned) Josh Kacher
Abstract Scope Cross-correlation-based electron backscatter diffraction (EBSD), also known as high angular resolution EBSD, provides approximately 2 orders of magnitude improvement in angular precision over Hough-based indexing, while also providing access to the three-dimensional elastic strain gradient tensor. Recent improvements in electron detection, specifically the advent of commercial direct detection options, raise the possibility of higher fidelity and more rapid measurements. In this talk, I will show results comparing the expected precision of different generations of electron detectors, including direct detection, based off of beam shift experiments taken from single crystal Si samples. I will also present a case study exploring the defect state in additive manufactured stainless steel characterized using direct detection EBSD patterns. Using OpenXY analysis, we are able to directly characterize the dislocation cell structures at high spatial and angular resolution, providing insight into potential defect formation mechanisms.
Proceedings Inclusion? Planned:
Keywords Characterization, Additive Manufacturing, Iron and Steel


A Multi-generational Study of Detectors for Use in Cross-correlation-based EBSD: From Scintillators to Direct Detection
Accelerating Dictionary Indexing with Principal Component Analysis
Application of a Differential Evolution Optimization Algorithm on Deformation Extraction from EBSD Patterns
Applications of 3D EBSD for Understanding Complex Microstructures
Challenges and Prospects of TKD for Nanocrystalline Materials Characterization
Cross-sectional Electron Channeling Contrast Imaging
Enhanced SEM-based Electron Diffraction Analyses Using Intelligent Hybrid Pattern Matching
Exploring New Capabilities in Electron Backscattered Diffraction Using Direct Electron Detectors
Extraction of Defect Images by Post-processing of EBSD Patterns
Fast Forward Model Indexing: Theory and Application
Kikuchipy: An Open-Source Toolbox for Analysis of EBSD Patterns
Micro-analysis of δ-hydrides in Pure Zirconium by HR-EBSD and TKD
Microstructural Evolution Revealed by EBSD in Aluminum Alloys After Severe Plastic Deformation
Phase Differentiation in Half- and Full-Heusler Composites Using EBSD
Phase Distinction of Ordered Intermetallic Phases Using EBSD
Spherical Indexing Based on Dictionary Indexing Applied to Overlapping Pattern of Low-scattering Forsterite Due to Small Grain Sizes
The Use of NLPAR in the Analysis of Low Misorientation Gradients
Toward Correlative Grain Boundary Analysis in CIGS

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