| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Extraction of Defect Images by Post-processing of EBSD Patterns |
| Author(s) |
Marc J. De Graef |
| On-Site Speaker (Planned) |
Marc J. De Graef |
| Abstract Scope |
An electron back-scatter diffraction (EBSD) pattern is formed when electrons that were Rutherford-scattered channel through the crystal lattice on their way out of the sample and intercept the detector plane. The Kikuchi band intensities are affected by the presence of lattice defects near the sample surface in the same way that high energy electrons are scattered by defects in a thin foil in a transmission electron microscope. The EBSD pattern therefore contains information not only of the small lattice rotations caused by defects but also of the displacement gradients surrounding the defects. This fact is used in electron channeling contrast imaging (ECCI) to visualize near-surface defects. In this presentation we will describe how EBSD patterns themselves can be analyzed post-acquisition, in an approach similar to 4-D STEM analysis, to produce ECCI-like defect images; we will provide examples of simulated and experimental defect images extracted from EBSD patterns. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, |