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Meeting 2024 TMS Annual Meeting & Exhibition
Symposium Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
Presentation Title Extraction of Defect Images by Post-processing of EBSD Patterns
Author(s) Marc J. De Graef
On-Site Speaker (Planned) Marc J. De Graef
Abstract Scope An electron back-scatter diffraction (EBSD) pattern is formed when electrons that were Rutherford-scattered channel through the crystal lattice on their way out of the sample and intercept the detector plane. The Kikuchi band intensities are affected by the presence of lattice defects near the sample surface in the same way that high energy electrons are scattered by defects in a thin foil in a transmission electron microscope. The EBSD pattern therefore contains information not only of the small lattice rotations caused by defects but also of the displacement gradients surrounding the defects. This fact is used in electron channeling contrast imaging (ECCI) to visualize near-surface defects. In this presentation we will describe how EBSD patterns themselves can be analyzed post-acquisition, in an approach similar to 4-D STEM analysis, to produce ECCI-like defect images; we will provide examples of simulated and experimental defect images extracted from EBSD patterns.
Proceedings Inclusion? Planned:
Keywords Characterization, Modeling and Simulation,


A Multi-generational Study of Detectors for Use in Cross-correlation-based EBSD: From Scintillators to Direct Detection
Accelerating Dictionary Indexing with Principal Component Analysis
Application of a Differential Evolution Optimization Algorithm on Deformation Extraction from EBSD Patterns
Applications of 3D EBSD for Understanding Complex Microstructures
Challenges and Prospects of TKD for Nanocrystalline Materials Characterization
Cross-sectional Electron Channeling Contrast Imaging
Enhanced SEM-based Electron Diffraction Analyses Using Intelligent Hybrid Pattern Matching
Exploring New Capabilities in Electron Backscattered Diffraction Using Direct Electron Detectors
Extraction of Defect Images by Post-processing of EBSD Patterns
Fast Forward Model Indexing: Theory and Application
Kikuchipy: An Open-Source Toolbox for Analysis of EBSD Patterns
Micro-analysis of δ-hydrides in Pure Zirconium by HR-EBSD and TKD
Microstructural Evolution Revealed by EBSD in Aluminum Alloys After Severe Plastic Deformation
Phase Differentiation in Half- and Full-Heusler Composites Using EBSD
Phase Distinction of Ordered Intermetallic Phases Using EBSD
Spherical Indexing Based on Dictionary Indexing Applied to Overlapping Pattern of Low-scattering Forsterite Due to Small Grain Sizes
The Use of NLPAR in the Analysis of Low Misorientation Gradients
Toward Correlative Grain Boundary Analysis in CIGS

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