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Meeting 2024 TMS Annual Meeting & Exhibition
Symposium Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
Presentation Title Exploring New Capabilities in Electron Backscattered Diffraction Using Direct Electron Detectors
Author(s) Daniel Gianola
On-Site Speaker (Planned) Daniel Gianola
Abstract Scope We demonstrate how the richness of information encoded in electron backscattered diffraction (EBSD) patterns is amplified by a new generation of direct electron detectors that enable high speed mapping and acquisition of high-fidelity patterns that can be used for statistically-meaningful crystallographic and defect analyses. We evaluate the potential benefits of acquiring patterns using direct electron detection and applying new analysis algorithms to advance the following applications: (i) high-speed mapping, (ii) orientation mapping of beam-sensitive oxide materials at low kV, (iii) quantitative energy mapping and filtering of diffraction patterns, and (iv) imaging and characterizing crystallographic defects. In the latter case, we quantify the sharpness of EBSD patterns obtained from several additively manufactured metallic alloys, which reveals sub-grain dislocation structures with high fidelity. Our results demonstrate that the dislocation cell walls produced during fast solidification do not always possess measurable misorientations, and thus do not reflect a geometrically necessary defect organization.
Proceedings Inclusion? Planned:


A Multi-generational Study of Detectors for Use in Cross-correlation-based EBSD: From Scintillators to Direct Detection
Accelerating Dictionary Indexing with Principal Component Analysis
Application of a Differential Evolution Optimization Algorithm on Deformation Extraction from EBSD Patterns
Applications of 3D EBSD for Understanding Complex Microstructures
Challenges and Prospects of TKD for Nanocrystalline Materials Characterization
Cross-sectional Electron Channeling Contrast Imaging
Enhanced SEM-based Electron Diffraction Analyses Using Intelligent Hybrid Pattern Matching
Exploring New Capabilities in Electron Backscattered Diffraction Using Direct Electron Detectors
Extraction of Defect Images by Post-processing of EBSD Patterns
Fast Forward Model Indexing: Theory and Application
Kikuchipy: An Open-Source Toolbox for Analysis of EBSD Patterns
Micro-analysis of δ-hydrides in Pure Zirconium by HR-EBSD and TKD
Microstructural Evolution Revealed by EBSD in Aluminum Alloys After Severe Plastic Deformation
Phase Differentiation in Half- and Full-Heusler Composites Using EBSD
Phase Distinction of Ordered Intermetallic Phases Using EBSD
Spherical Indexing Based on Dictionary Indexing Applied to Overlapping Pattern of Low-scattering Forsterite Due to Small Grain Sizes
The Use of NLPAR in the Analysis of Low Misorientation Gradients
Toward Correlative Grain Boundary Analysis in CIGS

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