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Meeting 2024 TMS Annual Meeting & Exhibition
Symposium Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
Presentation Title Toward Correlative Grain Boundary Analysis in CIGS
Author(s) Marzieh Baan, Tyler Grassman
On-Site Speaker (Planned) Marzieh Baan
Abstract Scope Prior work in the CuInGaSe2 (CIGS) thin-film photovoltaic materials system has identified defect levels with energies close to mid-gap energy and thus likely strong carrier recombination centers. These defects tend to cluster at specific grain boundaries, but the characteristics of these boundaries and their relationship to defect clustering and formation remain unknown. EBSD orientation mapping, correlated with site-specific defect-sensitive spectroscopies, should provide crucial insights into these issues. However, the naturally rough surfaces of CIGS — flattening risks altering the near-surface defect regions of interest — makes conventional EBSD extremely challenging, resulting in low signal-to-noise and unreliable, inaccurate indexing. Nonetheless, the use of spherical indexing for EBSD analysis of rough, un-flattened CIGS samples is found to yield much higher indexing accuracy, with a high grain-to-grain orientation correlation (r= 0.68) compared to analysis of the same regions after flattening, than that of conventional Hough indexing, paving the way for ongoing correlative analyses.
Proceedings Inclusion? Planned:
Keywords Electronic Materials, Characterization, Thin Films and Interfaces


A Multi-generational Study of Detectors for Use in Cross-correlation-based EBSD: From Scintillators to Direct Detection
Accelerating Dictionary Indexing with Principal Component Analysis
Application of a Differential Evolution Optimization Algorithm on Deformation Extraction from EBSD Patterns
Applications of 3D EBSD for Understanding Complex Microstructures
Challenges and Prospects of TKD for Nanocrystalline Materials Characterization
Cross-sectional Electron Channeling Contrast Imaging
Enhanced SEM-based Electron Diffraction Analyses Using Intelligent Hybrid Pattern Matching
Exploring New Capabilities in Electron Backscattered Diffraction Using Direct Electron Detectors
Extraction of Defect Images by Post-processing of EBSD Patterns
Fast Forward Model Indexing: Theory and Application
Kikuchipy: An Open-Source Toolbox for Analysis of EBSD Patterns
Micro-analysis of δ-hydrides in Pure Zirconium by HR-EBSD and TKD
Microstructural Evolution Revealed by EBSD in Aluminum Alloys After Severe Plastic Deformation
Phase Differentiation in Half- and Full-Heusler Composites Using EBSD
Phase Distinction of Ordered Intermetallic Phases Using EBSD
Spherical Indexing Based on Dictionary Indexing Applied to Overlapping Pattern of Low-scattering Forsterite Due to Small Grain Sizes
The Use of NLPAR in the Analysis of Low Misorientation Gradients
Toward Correlative Grain Boundary Analysis in CIGS

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