ProgramMaster Logo
Conference Tools for 2024 TMS Annual Meeting & Exhibition
Login
Register as a New User
Help
Submit An Abstract
Propose A Symposium
Presenter/Author Tools
Organizer/Editor Tools
About this Abstract
Meeting 2024 TMS Annual Meeting & Exhibition
Symposium Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
Presentation Title The Use of NLPAR in the Analysis of Low Misorientation Gradients
Author(s) David J. Rowenhorst
On-Site Speaker (Planned) David J. Rowenhorst
Abstract Scope Within EBSD analysis it is known that pattern quality is critical for successfully indexing patterns. Perhaps not as well understood, pattern quality strongly effects the accuracy of the orientation measurement, regardless of indexing method. The non-local pattern averaging and re-indexing (NLPAR) algorithm was developed to significantly improve pattern quality by averaging pattern signals that contain similar information, preventing signal mixing across high angle grain boundaries. It was less clear what effect this might have on low-angle boundaries. Here, using pattern simulation combined with traditional Radon indexing and Dictionary Indexing, we will show that this edge preserving feature of NLPAR is robust to small angle boundaries with misorientations less than 1, and in some cases as small as 0.1. Additionally, we will show that the increase in pattern quality using NLPAR improves indexing accuracy enough that measurements of kernel average misorientation are significantly improved in nearly data collection cases.
Proceedings Inclusion? Planned:

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

A Multi-generational Study of Detectors for Use in Cross-correlation-based EBSD: From Scintillators to Direct Detection
Accelerating Dictionary Indexing with Principal Component Analysis
Application of a Differential Evolution Optimization Algorithm on Deformation Extraction from EBSD Patterns
Applications of 3D EBSD for Understanding Complex Microstructures
Challenges and Prospects of TKD for Nanocrystalline Materials Characterization
Cross-sectional Electron Channeling Contrast Imaging
Enhanced SEM-based Electron Diffraction Analyses Using Intelligent Hybrid Pattern Matching
Exploring New Capabilities in Electron Backscattered Diffraction Using Direct Electron Detectors
Extraction of Defect Images by Post-processing of EBSD Patterns
Fast Forward Model Indexing: Theory and Application
Kikuchipy: An Open-Source Toolbox for Analysis of EBSD Patterns
Micro-analysis of δ-hydrides in Pure Zirconium by HR-EBSD and TKD
Microstructural Evolution Revealed by EBSD in Aluminum Alloys After Severe Plastic Deformation
Phase Differentiation in Half- and Full-Heusler Composites Using EBSD
Phase Distinction of Ordered Intermetallic Phases Using EBSD
Spherical Indexing Based on Dictionary Indexing Applied to Overlapping Pattern of Low-scattering Forsterite Due to Small Grain Sizes
The Use of NLPAR in the Analysis of Low Misorientation Gradients
Toward Correlative Grain Boundary Analysis in CIGS

Questions about ProgramMaster? Contact programming@programmaster.org