Abstract Scope |
In this work, we investigate the fatigue degradation in a variety of pure nanocrystalline metallic thin films, which are well known for their high-cycle fatigue resistance. We utilize a versatile Si micro-electro-mechanical-system (MEMS) microresonator on top of which we can deposit such metallic thin films. Through in situ scanning electron microscope (SEM) fully-reversed fatigue testing and periodic electron backscatter diffraction (EBSD) scans, we investigate the fatigue resistance of pure nanocrystalline Au, Al, Pt, and other metals, and evaluate fatigue initiation and propagation mechanisms, along with fatigue-induced microstructural evolution. Results highlight the influence of different materials properties (elasticity, strength, texture, etc.) in the fatigue behavior of these nanocrystalline metals.
Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA-0003525. |