| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Real Time Imaging
|
| Presentation Title |
Exploring the applications of contact-mode high-speed AFM |
| Author(s) |
Stacy Moore, Tomas Martin, Tom Scott, Oliver Payton, Loren Picco |
| On-Site Speaker (Planned) |
Stacy Moore |
| Abstract Scope |
The contact-mode high-speed atomic force microscope (HS-AFM) is an advanced real-time imaging technique with a powerful combination of capabilities. The HS-AFM is capable of performing nanoscale resolution measurements of surface topography with sub-second temporal resolution in ambient, liquid, or controlled gas environments. The enhanced throughput enables real-time observations of dynamic processes, as well as large area analysis of nanoscale microstructures. In addition to topographic measurements, the HS-AFM has imaging modes such as stiffness mapping, thermal and electrical conductivity mapping, and parallel potentiostatic control for electrochemical analysis. Applications of HS-AFM are wide ranging, from in-situ measurements of stress corrosion cracking through to in-vivo studies of biological cells. In this presentation, the innovations of HS-AFM will be discussed and some of the current applications will be explored. The presented work will focus on materials degradation phenomena in nuclear and aerospace industries, including fatigue, thermal and irradiation damage, and localised corrosion processes. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Nuclear Materials, Other |