About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Additive Manufacturing: Advanced Characterization with Synchrotron, Neutron, and In Situ Laboratory-scale Techniques III
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Presentation Title |
The New Capabilities of the Enhanced 32-ID at the APS-U: Opportunities for Additive Manufacturing Research |
Author(s) |
Samuel Clark, Kamel Fezzaa |
On-Site Speaker (Planned) |
Samuel Clark |
Abstract Scope |
The APS-U upgrade and the enhancement of beamline 32-ID provide new capabilities for researchers: 1) A Dual Beam Instrument enables simultaneous beams, one beam for full-field imaging while the second beam is focused and deflected on to the sample for diffraction or WAXS/SAXS. 2) The new APS-U source also enables Cone Beam projection x-ray Imaging (CBI) to bridge the full-field imaging resolution gap in the 50-1000 nm range for dynamic systems while preserving the single pulse (~ 300 ps) time resolution. In Additive Manufacturing, the new capabilities at 32-ID enable researchers to interrogate the evolution of microstructural attributes (precipitates, pores, cracks, etc.) at the nanoscale. The dual-beam imaging/diffraction capability will monitor the entire laser melting process with a full beam in real space while gaining additional insights from the site-specific phase and strain information from the focused beam for diffraction. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Additive Manufacturing, |