About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Additive Manufacturing: Advanced Characterization with Synchrotron, Neutron, and In Situ Laboratory-scale Techniques III
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Presentation Title |
Improving the Efficiency of Stress-strain Neutron Diffraction Using a Polychromatic Beam and Multiplexing |
Author(s) |
Sean Fayfar, Jay Theodore Cremer, Boris Khaykovich |
On-Site Speaker (Planned) |
Sean Fayfar |
Abstract Scope |
The development of new technology such as those found in electric cars and clean energy require advanced in-situ characterization techniques during manufacturing. Neutron scattering, one of the most powerful tools for material characterization, has gained prominence with improvements in beamline instrumentation at national facilities. Engineering beamlines have the capability to map out the residual stress within samples but require long measurement times due to small gauge volumes. We present our developments of a stress-strain diffractometer intended to be optimized for improved efficiency compared with current designs. The diffractometer utilizes a polychromatic beam to illuminate all lattice planes within the sample at a fixed angle. A series of focused bent-perfect silicon analyzers are placed after the sample using multiplexing. We present our results on the development of this prototype diffractometer from both experimental testing and ray-tracing simulations along with the current state of construction at the MIT Reactor. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Iron and Steel, Mechanical Properties |