About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Additive Manufacturing: Advanced Characterization with Synchrotron, Neutron, and In Situ Laboratory-scale Techniques III
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Presentation Title |
X-ray Diffraction-computed Tomography (XRD-CT) Facility at NSLS-II for Studying Materials for Nuclear Applications |
Author(s) |
Mehmet Topsakal, Simerjeet Gill |
On-Site Speaker (Planned) |
Mehmet Topsakal |
Abstract Scope |
X-ray scattering techniques coupled with world-class intensity and brightness of the National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory enable an exceptional opportunity for non-destructive studies of high-Z materials such as uranium-alloys. We will give a brief overview of a x-ray diffraction based computed-tomography (CT) endstation at 28-ID beamline of NSLS-II for synchrotron characterization resources for nuclear science community under the umbrella of Nuclear Science User Facilities (NSUF). It is a unique endstation which can focus the x-ray beam down to ~20 um in high-energy regime (>67 keV) and intended to be a crosscutting tool that will enable multi-modal imaging of high-Z materials, a crucial capability for nuclear materials research. In addition, a broad overview of preliminary results on various user experiments projects such as mapping the lattice strain in irradiated materials or the microstructure of additively manufactured materials will be presented. |
Proceedings Inclusion? |
Planned: |
Keywords |
Nuclear Materials, Additive Manufacturing, Characterization |