Abstract Scope |
Analysis of grain structures requires the knowledge of quantities like grain size, grain boundary area and triple-line length, which are typically measured from a surface mesh. Generally, a surface mesh is not readily available from experiments, like 3DXRD and DCT, or simulations that utilize an implicit representation of the grain structure, like the phase field method or the level-set method. To avoid the laborious meshing process, in this work, we propose an approach to measure geometrical quantities directly from the implicit representations. Here we focus on the phase field representation. The level-set representation can be easily converted into the phase field one via an analytical relation and the voxelized grain map from experiments can be transformed accordingly by a phase field smoothing process. The proposed method is demonstrated by several examples of measuring these important geometrical parameters on grain structures. |