About this Abstract |
Meeting |
6th International Congress on 3D Materials Science (3DMS 2022)
|
Symposium
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6th International Congress on 3D Materials Science (3DMS 2022)
|
Presentation Title |
Buried Within: Targeted 3D Multiscale Imaging and Analysis in Bulk Samples |
Author(s) |
Stephen T. Kelly, Robin White, Hrishikesh Bale, Sam Kalirai, William Fadgen, William Harris, Tobias Volkenandt |
On-Site Speaker (Planned) |
Stephen T. Kelly |
Abstract Scope |
Multiscale, multimodal, correlative imaging presents a powerful opportunity for materials research, especially when extended beyond 2D surface imaging and into the 3D realm where true microstructures and important properties of complex, functional materials can be characterized. Traditional approaches to targeted multiscale 3D characterization have relied on near-surface regions in a quasi-3D or 2.5D approach, or complex disconnected bulk sectioning to reveal deeply buried features. The advent of the femtosecond laser and its subsequent integration into modern FIB-SEM instruments has opened the door for a radically different approach to this type of work where 3D non-destructive X-ray microscopy images can be used to guide active exposure and analysis of targeted, deeply buried regions of interest in bulk samples. Beyond analysis in the FIB-SEM instrument, samples can be prepared for analysis with other techniques. We demonstrate the utility of this workflow on samples ranging from advanced electronic packaging to battery electrodes. |
Proceedings Inclusion? |
Definite: Other |