|About this Abstract
||2020 TMS Annual Meeting & Exhibition
||Recent Developments in Biological, Structural and Functional Thin Films and Coatings
||Elaboration and Characterization of Thin Films of SiP Lamellar Alloys
||Mathieu Stoffel, Sebastien Geiskopf, Alix Valdenaire, Xavier Devaux, Erwan André, Cedric Carteret, Alexandre Bouché, Michel Vergnat, Hervé Rinnert
|On-Site Speaker (Planned)
Group IV-V semiconductor alloys have received only little attention till now. Very recently, however, DFT calculations have shown that SiP is an indirect bandgap semiconductor which becomes direct when being thinned to a monolayer. Moreover, SiP is a lamellar alloy which is promising for future 2D optoelectronic devices.
In this work, we investigate SiP thin films prepared by evaporation under high vacuum.The films were prepared by co-evaporation of Si from an e-beam and P from a GaP decomposition source. The structural and vibrational properties were investigated by means of X-ray diffraction (XRD), scanning transmission electron microscopy (STEM) and the associated spectroscopies (EDS and EELS), infrared and Raman spectroscopies. After annealing at 1100°C, STEM investigations reveal the presence of lamellar SiP grains crystallizing in an orthorhombic structure which coexist with Si polycrystals. The features observed in both infrared and Raman spectra are found to be in excellent agreement with DFT calculations.
||Planned: Supplemental Proceedings volume