About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
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Recent Developments in Biological, Structural and Functional Thin Films and Coatings
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Presentation Title |
Engineering Nonlinear Optical Materials by Magnetron Sputtering with In situ Ellipsometry, Optical Emission Spectroscopy and Machine Learning |
Author(s) |
John Jones, Shawn A Putnam, Lirong Sun, Cynthia T. Bowers, Jake T. Carter, Nanthakishore Makeswaran, Ramana V Chintalapalle, Augustine M Urbas |
On-Site Speaker (Planned) |
John Jones |
Abstract Scope |
Nanomaterials research requires the ability to measure and characterize materials created experimentally that have nanoscale features, which can be extremely difficult for traditional methods of synthesis. For example, layered oxide materials or dielectric stacks having alternating repeated layer thicknesses of 10 nm or less are difficult to make with sharp interfaces. These films can be multilayer structures designed in such a manner as to realize a nonlinear optical response, resulting in nonlinear effects such as second harmonic generation (SHG). In Situ ellipsometry is used in conjunction with modulated pulsed power (MPP) and pulsed DC magnetron sputtering (MS) for precision growth of the nanolaminates, SEM/TEM/EDS will be used for ex situ materials characterization. This technology is important because for example it can allow detection of IR signals through upconversion, or speed materials development of nanostructured materials of desired optical or electrical properties through machine learning of processing and in situ characterization. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |