| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Materials through High Resolution Coherent Imaging
|
| Presentation Title |
MHz Microscopy at European XFEL |
| Author(s) |
Patrik Vagovic, Pablo Villanueva Perez, Tokushi Sato, Valerio Bellucci, Sarlota Birsteinova, Henry J Kirkwood, Richard Bean, Romain Letrun, Jayanath Koliyadu, Rita Graceffa, Antonio Bonucci, Adrian P. Mancuso, Alke Meents, Henry N Chapman |
| On-Site Speaker (Planned) |
Patrik Vagovic |
| Abstract Scope |
MHz rate fourth generation hard X-ray XFEL source European XFEL provide opportunity for characterisation of stochastic dynamics occurring in various systems. High repetition rate of pulses together with high flux per pulse allow to record projected X-ray radiograms of dynamic samples and image more then million frames per second with high resolution. Each such frame is illuminated using ultrashort exposure given by the X-ray pulse duration providing “frozen in time” snapshots of stochastic phenomena. This enable to film fast stochastic processes individual realisations in slow smooth motion. The unique performance allows for implementation of X-ray beam splitting schemes of multiprotection microscopy to obtain 3D snapshots per single pulse of dynamic objects sampled at MHz rate. We will present applications of recently developed MHz XFEL projection X-ray microscopy and present multi-projection MHz X-ray which is being developed under EIC-Pathfinder MHz-Tomoscopy project at SPB/SFX instrument. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Aluminum, Other |