About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
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Characterization of Materials through High Resolution Coherent Imaging
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Presentation Title |
Coherent Surface Scattering Imaging with Nanometer Resolution for 3D Mesoscale Structures at Surfaces and Interfaces |
Author(s) |
Zhang Jiang, Peco Myint, Ashish Tripathi, Miaoqi Chu, Mathew J Cherukara, Suresh Narayanan, Nicholas Schwarz, Jin Wang |
On-Site Speaker (Planned) |
Zhang Jiang |
Abstract Scope |
Coherent surface scattering imaging (CSSI) is a recently developed high-resolution non-destructive X-ray imaging technique for imaging supported nanostructures at surfaces and buried interfaces. CSSI takes advantage of the established coherent imaging techniques in transmission geometry, such as CDI and ptychography, but operates in grazing-angle geometry and thus can potentially probe non-periodic nano-features in thin-film based 3D systems. A one-of-a-kind CSSI beamline is being developed as a featured beamline for the APS Upgrade. In this talk, I will present the progress of the dedicated CSSI beamline, as well as the CSSI methodology and imaging reconstruction. |
Proceedings Inclusion? |
Planned: |
Keywords |
Thin Films and Interfaces, Characterization, |