About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
|
Characterization of Materials through High Resolution Coherent Imaging
|
Presentation Title |
Characterisation of Material Defects via Plasmon-enhanced Phase Imaging |
Author(s) |
Brian Abbey |
On-Site Speaker (Planned) |
Brian Abbey |
Abstract Scope |
We have recently demonstrated the feasibility of plasmon-enhanced colourimetric imaging of thin optically transparent films (Balaur et al., Nature, 2021) and of plasmon-enhanced quantitative phase imaging (Cadenazzi et al., Nature Photonics, 2021). We then extended these methods in order to examine the dielectric properties of ion-implanted thin films (Sadatnajafi, Advanced Functional Materials, 2022) and demonstrated that plasmon-enhanced colourimetric imaging and Monte-Carlo simulations could be used together for the quantitative determination of ion implantation dose with extreme sensitivity. Here, we demonstrate that the combination of phase contrast imaging and plasmon-enhancement enables a new approach to characterising material defects in thin films. The first experimental results using this novel technique will be presented. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Thin Films and Interfaces, Surface Modification and Coatings |