| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Materials through High Resolution Coherent Imaging
|
| Presentation Title |
"Similarity Mapping" Using Precession Electron Diffraction Data |
| Author(s) |
Marcus Hansen, Ainiu L. Wang, Jiaqi Dong, Kelvin Y. Xie |
| On-Site Speaker (Planned) |
Marcus Hansen |
| Abstract Scope |
Grains in many material systems are not randomly oriented. Rather, they exhibit specific orientation relationships with the substrate or with each other. To efficiently map the same domains or variants is effort-demand, especially at the nano-scale. In this work, we report a method to map grains of similar orientations by computing the similarity between the reference pattern and the diffraction pattern of each pixel acquired using precession electron diffraction (PED). We first determine an optimal denoising algorithm. Next, "similarity maps" were generated to examine across the dataset to reveal the distribution of the same domain/variant of the system. Its application on epitaxially grown thin films and nanometer-size martensite will be discussed. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Nanotechnology, Thin Films and Interfaces |