Abstract Scope |
The X-ray fluorescence microscopy (XFM) beamline at the Australian Synchrotron has recently implemented ptychography as a user experiment [1]. The fast-scanning coherent X-ray diffraction microscopy method benefits from the optimized high-speed “megapixels per hour” scanning architecture developed for XFM, and the dead-time free noiseless photon-counting operation of a hybrid pixel detector. Free-run data collection is demonstrated to improve the quality and reliability of ptychography image reconstruction. This makes ptychography compatible as a simultaneous experiment to XFM mapping. Extremely high scan area coverage up to 140 µm2 s-1 has been achieved at up to 250 µm s-1 scan velocity, over regions up to 352 000 mm2, with a reconstructed image resolution gain of 13× compared to the beam size. The combination of these methods provides unique morphological context for elemental and chemical information, enabling novel scientific outcomes.
[1] M. W. M. Jones, et al. J. Synchrotron Rad. 29, 480-487 (2022). |