About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
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Characterization of Materials through High Resolution Coherent Imaging
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Presentation Title |
Solving Complex Structures with Electron Ptychography |
Author(s) |
Yu-Tsun Shao, Zhen Chen, Yi Jiang, Chenyu Zhang, Harikrishnan K.P., David A. Muller |
On-Site Speaker (Planned) |
Yu-Tsun Shao |
Abstract Scope |
Electron microscopy is a widespread and often essential tool for structural and chemical analysis at the atomic level. The ultimate limit to spatial resolution in an electron microscope is set by the thermal vibrations of the atoms themselves, which are on the order of 10-20 pm. By combining the full 4D-phase space information (4D-STEM) and multislice electron ptychography algorithm, we are now able to see the details of thermal vibrations of individual atom columns. Furthermore, this also allows for 3D structure determination for both light and heavy elements.
The improved resolution, dose efficiency enabled by ptychography make it easy to identify defects such as sulfur monovacancies, or shear distortions in twisted bilayers. For oxide heterostructures, we demonstrate the 3D imaging of a single Tm dopant atom in Gd3Ga5O12 samples, as well as determine complex polar textures and octahedral tilts in BiFeO3/TbScO3 superlattices and NaNbO3 thin films. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Thin Films and Interfaces, |