About this Abstract |
Meeting |
2023 TMS Annual Meeting & Exhibition
|
Symposium
|
Characterization of Materials through High Resolution Coherent Imaging
|
Presentation Title |
Ultrafast Dark-field X-ray Microscopy – A New Tool for Multiscale Analysis
|
Author(s) |
Leora E. Dresselhaus-Marais |
On-Site Speaker (Planned) |
Leora E. Dresselhaus-Marais |
Abstract Scope |
Defects and structural distortions dictate important hierarchical crystalline and defect dynamics in metals and functional materials. But many processes – from fracture to phase transitions – have dynamics that depend on multiscale dynamics that are difficult to reconcile between mm-A lengthscales and ms-ps timescales. Dark-field X-ray microscopy (DFXM) can now directly image defects in single- and poly-crystals, resolving distortions deep beneath the surface over a wide field of view, with high sensitivity to strain and inclination in the lattice. We have developed time-resolved DFXM over the past 5 years for multiscale analysis of dynamics, and recently extended this to ultrafast timescales at X-ray free electron lasers. I will present the new DFXM toolbox we have developed and demonstrate how it informs dislocation dynamics and thermal engineering. Our DFXM experiments can now collect movies of mesoscale deformation processes in-situ over ms-fs timescales, offering key opportunities to inform models yet untested. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, |