|About this Abstract
||2021 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||Grain Orientation Mapping via Laue Peak Segregation
||Yueheng Zhang, Matthew James Wilkin, Anthony Rollett, Robert Suter
|On-Site Speaker (Planned)
The 34-ID-C beamline at the APS has recently acquired the capability to conduct Laue Diffraction, a technique in which a polychromatic X-ray source illuminates a crystal, causing multiple reflections to simultaneously fulfill the Bragg condition and casting a unique Laue pattern on a detector. By rastering this beam across a polycrystalline sample, Laue patterns can
be collected from all grains in a region of interest. When many grains are illuminated at the same time, their Laue patterns overlap on the detector, making it impossible to index peaks. We demonstrate an algorithm for segregating overlapping Laue patterns by sorting peaks into groups based peak center-of-mass, indexing all peaks in each separated group, and combining the results to build an orientation map of the microstructure. This tool will allow us to intelligently conduct Coherent X-ray diffraction experiments on grains of interest below the resolution of EBSD.