|About this Abstract
||2021 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||Laboratory and Synchrotron-based X-ray Tomographic Imaging during In Situ Loading of Materials
||Brian M. Patterson, Lindsey Kuettner, Cindy Welch, Paul Welch, Axinte Ionita, Nikhilesh Chawla, Xianghui Xiao
|On-Site Speaker (Planned)
||Brian M. Patterson
The X-ray 3D imaging and collection of material response during loading allows materials researchers to directly identify failure mechanisms. Laboratory-based sources are used to acquire the initial morphology of the material which is often used as a starting point for mechanical modeling. Synchrotron light sources, such as the Advanced Photon Source, are useful in that the high X-ray flux allows researchers to acquire high speed, 3D images during loading. The uniaxial loading of a variety of soft, composite, as well as 3D printed materials up to ~0.4 /s strain rates will be used to highlight the lessons learned for these types of experiments. Analysis of the images through the use of advanced techniques, such as eigenvector centrality, digital volume correlation, as well as finite element modeling, will be shown. These techniques provide opportunities to validate material models by the side-by-side comparison of the modeled performance to the mechanical response.