|About this Abstract
||2021 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||In Situ and Operando 3D Nano-imaging for Materials Science at the ESRF
||Julie Villanova, Richi Kumar, Victor Vanpeene, Jaime Segura-Ruiz, Remi Tucoulou, Pierre Lhuissier, Luc Salvo
|On-Site Speaker (Planned)
X-ray computed tomography is now well recognized as a powerful technique to investigate material properties from the micro to the nano-scale. The use of phase contrast imaging provides non-destructive access to 3D morphology, by highlighting small features of differing refractive index within structures that are otherwise uniform or within weak absorbing materials. Thanks to the high flux of synchrotron X-ray nano-beams and the constant improvement of the detectors, fast acquisition rates are now reachable at the nano-scale, leading to dynamic monitoring of phenomena through in situ and operando measurements. This work presents the in situ hard X-ray nanotomography setup that has been developed at the ID16B beamline of the ESRF. It details different examples of studies on metallurgy and energy materials, and the technical developments associated. Finally, the benefits and limitations brought to the technique by the new extremely brilliant X-ray source EBS of the ESRF are discussed.