|About this Abstract
||2021 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||Study of Structure of Beam-sensitive Supported Nanoparticle Catalysts by Low-dose High Resolution Phase Contrast Imaging
||Cheng-Han Li, Joerg Jinschek
|On-Site Speaker (Planned)
Phase contrast imaging (PCI) in scanning / transmission electron microscopy (S/TEM) has been widely utilized to reveal the structure of materials with high spatial resolution and high sensitivity. In general, acquisition of an image series, such as focal series, are necessary to generate sufficiently high S/N data that is further processed using algorithm to restore the phase contrast and amplitude contrast images. However, such extended exposure to high-energy electrons might be too invasive for electron-beam-sensitive materials, such as highly active supported nanoparticles catalysts. Thus, strategies have to be applied managing electron dose and minimize invasive electron-beam effects. In this study, high-resolution PCI with optimized electron-dose exposure and fast-speed direct electron detection have been utilized to reveal the pristine microstructure of supported noble metals model catalysts, correlated with simulated images. Low-dose PCI methods are essential to characterize beam-sensitive materials with high spatial resolution.
||Characterization, Modeling and Simulation,