About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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Mechanical Response of Materials Investigated through Novel In-situ Experiments and Modeling
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Presentation Title |
Interface Characteristics of Tailored Thin Films Examined Using Micromechanical Spectroscopy |
Author(s) |
Markus Alfreider, Michael Meindlhumer, Tobias Ziegelwanger, Rostislav Daniel, Jozef Keckes, Daniel Kiener |
On-Site Speaker (Planned) |
Markus Alfreider |
Abstract Scope |
Interfaces are inherently small by nature – so are thin films. This leads to the necessity of using investigation techniques with a high spatial resolution or very small probed volumes to understand their unique mechanical characteristics without any ‘background noise’ from the substrate. While many of these methodologies lead to quasi-static parameters, dynamic testing techniques are still not common, leaving inherently dynamic parameters, such as damping to be unknown.
In the present work we address this lack of methodology by showcasing a novel frequency sweep technique, termed micromechanical spectroscopy (µMS) on micron sized cantilever shaped specimens. The changes in resonance peak height and position allow to determine damping and stiffness of the specimens, which is in direct correlation to the dissipated energy within modified interfaces.
In conjunction with supporting correlative techniques we are able to quantify interface relaxation of precipitates within a 6 µm thin AlCrN hard coating. |
Proceedings Inclusion? |
Planned: |
Keywords |
Thin Films and Interfaces, Characterization, Mechanical Properties |