| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
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| Symposium
|
Neutron and X-ray Scattering in Materials Science and Engineering
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| Presentation Title |
From Angstroms to Micrometers: Across-length-scale Structural Characterization of Hard Materials via X-ray Scattering |
| Author(s) |
Fan Zhang, Jan Ilavsky, Andrew Allen, Lyle Levine |
| On-Site Speaker (Planned) |
Fan Zhang |
| Abstract Scope |
Hard materials such as alloys, ceramics, glass, and composites have significant economic and societal value and impact numerous industries. Continued optimization and development of these materials demand a fundamental understanding of the processing-structure-property relationships. However, their structures span from sub-angstrom to micrometer scales and beyond, posing significant challenges for structural characterization. To address this, the National Institute of Standards and Technology and the Argonne National Laboratory, through a partnership spanning over 25 years, have developed a unique structural characterization facility based on ultra-small-angle X-ray scattering at the Advanced Photon Source. This facility is currently capable of performing continuous structural characterization from angstroms to micrometers with a 1-minute time resolution, enabling a wide range of in-situ and ex-situ studies of hard materials. In this talk, we will use additively manufactured alloys and advanced ceramics as examples to highlight the metrology development and illustrate its potential to advance hard materials research. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Additive Manufacturing, Ceramics |