| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Neutron and X-ray Scattering in Materials Science and Engineering
|
| Presentation Title |
The development of a stress-strain diffractometer at the MIT Reactor using a polychromatic beam |
| Author(s) |
Sean Fayfar, Jay Theodore Cremer, Boris Khaykovich |
| On-Site Speaker (Planned) |
Sean Fayfar |
| Abstract Scope |
The development of new technology such as those found in electric cars and clean energy require advanced in-situ characterization techniques during manufacturing. Neutron scattering, one of the most powerful tools for material characterization, has gained prominence with improvements in beamline instrumentation at national facilities. Engineering beamlines have the capability to map out the residual stress within samples but require long measurement times due to small gauge volumes. We present our developments of a stress-strain diffractometer intended to be optimized for improved efficiency compared with current designs. The diffractometer utilizes a polychromatic beam to illuminate all lattice planes within the sample at a fixed angle. A series of focused bent-perfect silicon analyzers are placed after the sample using multiplexing. We present our current developments at the MIT Reactor that include experimental measurements of a ring-and-plug standard sample that we measured at the HIDRA beamline as a benchmark. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, |