|About this Abstract
||2022 TMS Annual Meeting & Exhibition
||Advanced Functional and Structural Thin Films and Coatings
||In-situ Mapping of Local Orientation and Strain in a Fully Operable Infrared Sensor Using Dark Field X-ray Microscopy
||Can Yildirim, Philippe Ballet, Patrice Gergaud, Francois Boulard, Tao Zhou, Raphael Pesci, Tobias Schulli, Nicolas Baier, Thanh Nguyen, Brellier Delphine
|On-Site Speaker (Planned)
Hybridized focal plane array HgCdTe (MCT) sensors are the workhorse of high performance infrared detectors covering a broad range of applications from space investigation to gas monitoring. Here we dark-field X-ray microscopy (DFXM) to map the structural variations of a fully operable MCT sensor at temperatures down to 80 K. We report, for the first time, on the nanoscale structural evolution over a large population of photodiodes at operating temperatures with high spatial and angular resolution. Our results show that lattice distortion and strain in the MCT epilayer increases at lower temperatures. The FWHM values of the rocking curves reach up to 0.02° at 80 K, three times higher than the room temperature value. The thermal cycle results show that the thermal effects are almost completely reversible and the measure strain is in the elastic regime. We discuss the origin of the temperature-generated structural modifications using complimentary finite element modelling.
||Electronic Materials, Characterization, Other