About this Abstract |
Meeting |
2021 TMS Annual Meeting & Exhibition
|
Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
A Study on Migrating Boundary Induced Plasticity Using Atomistic Simulation |
Author(s) |
Simoon Sung, Jaehoon Jang, Hyerim Hwang, Yanghoo Kim, Heung Nam Han |
On-Site Speaker (Planned) |
Simoon Sung |
Abstract Scope |
It is known that a permanent deformation occurs in even a very low-stress state while a solid-solid phase transformation proceeds in metallic materials. A similar phenomenon is also observed during recrystallization and/or grain growth. To explain these phenomena, the concept of migrating boundary induced plasticity (MIP) had been suggested based on the acceleration of Coble creep on migrating boundary. In this presentation, we confirmed the existence of MIP developed during grain growth using molecular dynamics (MD) simulation. To quantify MIP strain, we applied the various stresses, which is a level below the dislocation nucleation, to unit cell consisted of polycrystalline iron and subtract the elastic part from total deformation. The correlation between MIP strain and migrating boundary velocity was analyzed under the various temperature and stress conditions. |
Proceedings Inclusion? |
Planned: |
Keywords |
Other, Other, Other |