About this Abstract |
Meeting |
2021 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Recent Advances in Applying In-situ Electron Microscopy for Local Determination of Crack Processes |
Author(s) |
Daniel Kiener, Markus Alfreider, Inas Issa, Michael Wurmshuber, Michael Burtscher, Klemens Schmuck |
On-Site Speaker (Planned) |
Daniel Kiener |
Abstract Scope |
Failure due to crack initiation and propagation is a dramatic event with an intrinsically local nature. In-situ electron microscopy is therefore ideally suited to detail the nanoscale deformation and failure processes occurring at crack tips or in their vincinity. In the present contribution, we will highlight recent advances in scale bridging fracture tests from the macroscale down to the micro- and nanometer level by conducting quantitative miniaturized fracture experiments inside scanning and transmission electron microscopes. Employing recent advances such as continuous stiffness evaluation, digital image correlation or local strain mapping, we will demonstrate the rich information that can be extracted from such kinds of experiments to detail, for example, the local stress state near the crack tip as well as individual dislocation processes and shielding events occurring in the vicinity of the crack. Furthermore, the influence of specific interfaces on the crack propagation will be addressed. |
Proceedings Inclusion? |
Planned: |
Keywords |
Mechanical Properties, Characterization, |