Abstract Scope |
We explore the potential of using a new form of Electron Backscatter Diffraction (EBSD) by combining Integrated Digital Image Correlation, a well-established tool in experimental mechanics for highly accurate identification of e.g. material properties, with High angular Resolution EBSD, a well-established tool to attain local relative stresses. Through a rigorous derivation of the optimization scheme, employing brightness conservation between EBSD patterns (EBSPs), a direct one-step correlation of the maximum overlapping field-of-view of the EBSPs is achieved. Furthermore, crystal symmetry, out-of-plane-stress state and co-correlation of detector geometry are fully exploited, yielding simultaneous correlation of all overlapping regions of interest in multiple intergranular EBSPs. As a result, accurate measurement of absolute stress, crystal orientation and EBSD geometry, using limited assumptions, is demonstrated on a virtual polycrystalline case-study, showing errors below 10E-4 in elastic strain and 7E-5 rad in orientation, without using simulated EBSPs as reference; experimental validation is underway. |