About this Abstract |
Meeting |
2021 TMS Annual Meeting & Exhibition
|
Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
High Resolution Characterization of Dislocations Using Weak Beam Dark Field Scanning Transmission Electron Microscopy |
Author(s) |
Jiashi Miao |
On-Site Speaker (Planned) |
Jiashi Miao |
Abstract Scope |
Plastic deformation and mechanical behavior of alloys are mainly controlled by dislocation slip and interactions between dislocations. Dislocation characterization using electron microscopy can greatly help the understanding of deformation mechanisms. Recently, a new high resolution defect characterization technique: weak beam dark field scanning transmission electron microscopy (WB DF STEM) was developed. Experimental study showed that WB DF STEM imaging can provide the same resolution in the characterization of dislocations as that offered by the conventional weak beam dark field transmission electron microscopy (WB DF TEM). In this work, WB DF STEM images under different imaging conditions were simulated. Simulation results prove that high resolution imaging of dislocation structures can be achieved in WB DF STEM under proper imaging conditions. The examples of the application of WB DF STEM imaging in studying deformation substructures in different engineering alloys will be given. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Mechanical Properties, Modeling and Simulation |