About this Abstract |
Meeting |
2021 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Fingerprinting Shock-induced Deformations via Virtual Diffraction |
Author(s) |
Avanish Mishra, Cody Kunka, Marco J. Echeverria, Rémi Dingreville, Avinash M. Dongare |
On-Site Speaker (Planned) |
Avanish Mishra |
Abstract Scope |
The current understanding of the operating deformation mechanisms in metallic materials under shock loading conditions relies on in-situ X-ray diffraction (XRD) experiments. While these experiments can characterize the evolution of the defects and phases, a quantitative understanding of the microstructure's contributions is challenging. Large scale molecular dynamics simulations generated shock-deformed microstructures are analyzed using virtual XRD and selected area electron diffraction (SAED) to fingerprint deformation twin, phase transformation, and stacking faults (SFs) in FCC and BCC metals. The correlations between peak intensity, shift, and broadening in SAED and XRD profiles and volume fractions/densities of twins, and phase transformed regions are investigated for shocked single-crystal Cu, Ta, and Fe. The virtual characterization tools enabled fingerprinting of the twinning and de-twinning behavior in Ta, SFs in Cu microstructures, as well as the BCC-to-HCP and reverse phase transformation in Fe. The observed correlation and the ability to fingerprint diffraction patterns will be presented. |
Proceedings Inclusion? |
Planned: |