Abstract Scope |
Electron backscatter diffraction (EBSD) is a surface characterization technique, based in the scanning electron microscope, to extract location specific crystallographic orientation information from crystalline materials. Conventional setup of the EBSD involves analysis of Kikuchi patterns that are gnomonically projected onto a flat phosphor screen. We report in this study a fully automated method to recover the spherical Kikuchi map from experimental Kikuchi patterns. First, experimental patterns are filtered based on the pattern quality, relative misorientation and cross-correlation coefficient with simulated patterns. Next, inverse gnomonic projection can be implemented to transform the collected pattern in the gnomonic projection frame to the detector frame before rotating it into the correct orientation in the Cartesian crystal frame (Figure). This method potentially enables more accurate orientation determination, new pattern center refinement method, and EBSD based phase identification. |