|About this Abstract
||2022 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Line Profile Analysis from In Situ Synchrotron X-ray Diffraction to Study the Microstructural Evolution during Elasto-plastic Transition in Nickel with Bimodal Grain Structure
||Elis Sjogren, Wolfgang Pantleon, Ulrich Lienert, Zoltan Hegedüs, Kei Ameyama, Dmyto Orlov
|On-Site Speaker (Planned)
Materials with bimodal grain size distributions have an attractive combination of strength and ductility. The elasto-plastic transition of such materials requires thorough investigations. In this study, nickel with bimodal grain structure was deformed in tension until 4% strain while recording powder diffraction patterns at the synchrotron beamline P21.2 at PETRA III. Line profile analysis based on powder diffraction data enables quantification of stress states and lattice defect densities in different phases in multi-phase materials. Bimodal size distributions in single-phase materials add extra complexity due to the absence of differences in composition and crystal structure. We will present a method for acquiring and separating diffraction profiles originating individually from coarse and fine grains. The analysis reveals a stress-strain behavior of both grain fractions similar to their homogenous counterparts apart from an increased work-hardening rate of the coarse grains. More advanced line profile analysis will provide further insights on the elasto-plastic transition.