|About this Abstract
||2022 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Low kV EBSD & Physics-based Modeling of Dislocation Cell Structures in Aluminum
||Toby Francis, Chaoyi Zhu, Elizabeth Holm, Marc De Graef
|On-Site Speaker (Planned)
The evolution of dislocation cell structures lies at the center of many fundamental problems in additively manufactured metals, especially those involving recrystallization. The speed, resolution, and samples thickness accessible to modern electron backscatter diffraction (EBSD) holds the key to bridging the length-scales of the dislocation cell structure and the overall grain structure. However, imaging heavily deformed materials with high orientational accuracy within sub-grains at the resolution necessary to resolve the dislocation cell structure pushes the fundamental limits of EBSD. Combining advancements in physics-based modeling of EBSD with the sensitivity of direct electron detectors allows for imaging at lower accelerating voltages and increases the effective resolution of EBSD. Moreover, coupling an inverse model to the EBSD simulations can allow for the determination of the elastic strain field, crucial to recovery. These concepts are used to investigate the kinetics of recrystallization in aluminum using an in-situ heating rig.
||Characterization, Modeling and Simulation, ICME