|About this Abstract
||2022 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Improving 2D Diffraction Peak Detection Using Shannon Entropy
||Kieran Nehil-Puleo, Jonthan Z Tischler, Philip Eisenlohr
|On-Site Speaker (Planned)
High-energy X-ray diffraction at synchrotron facilities frequently utilizes area detectors since the positions of diffraction peaks encode useful information about the illuminated crystal lattice. To pinpoint these locations, we propose a novel strategy that filters the raw (and typically noisy) intensity by calculating the Shannon entropy within a sliding window. The resulting image is thresholded at a value determined from the 90% and 95% intensity percentile. The intensity-weighted averaged positions of the resulting islands are then taken as the respective peak locations. We compare this modified strategy to the one presently established at beamline 34-ID-E (Advanced Photon Source) and found it to be more robust when the signal-to-noise ratio is low.